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如何?定f玜KUO楲??
桘子散q狈治鲋校XXXXXR詚iaK(Steady State)}P果作p悍治鲆纃冢诖藃纋料驴梢詨啦斓秸鸓模型q盭4流X4zi定後的}P果。如需壚察n葨╢B晸媻化的曲某某,RG必??定枿fB晸媻化的q痹?Transient Attribute)、f玜KfB晸}哺?Transient Grid),以便壚察各fB晸炥整氃?算S@域的q绷縋硱^速度及流氃d誶繿K。以下以一[鏂洶咐饽衬矲LOTHERM中f玜K?定的流程。
f玜KUO楲建立流程:
一、模型建立?^~何尺寸?定:
模型建立娝S?**之”FLOTHERM基y姴程?}艚滩?rdquo;一fR韵聀篰~何尺寸?定
二、PCB板q痹磰-定:
三、f玜Kq痹磰-定:
Enclosure的六P面上均提供如上W之v|q绷繓╢B晸媻化的Transient Source。
四、ex值}P果榦示及姫明:
由上W}P果可以得知,在350秒的fB候NC1晶片已超怤最大容?n萫氏125度,所以在350秒的fB候此堓置已q!法正常怟作。
五、W形化後哢理:
UO答集
Question 1:使用FLOTHERM解lzf玜KUO楲需注意的事?。
Answer:(1) 必??定材岅的密度(Density)及比q?Specific Heat)。一般求解ziaK的案例中,因密度及比q辈粬╢B晸的媻化,所以可以忽略不?定。
(2) fB晸}哺? Transient Grid )。FLOTHERMp阂蛔訰諁哺裣礡誵绷髂鞄邭裕瑄v?定f玜Kq痹匆葬幔瑤邭员旧韌自R諍-定其fB晸}哺瘛K評v求解f玜KUO楲fB,可先?定f玜Kq痹丛賷-定fB晸}哺瘛?/p>
Question 2: 如何?定f玜Kq痹?!
Answer:f玜Kq痹礃g名思﹑簐|q绷繓╢B晸而改媻,FLOTHERM中提供以下^~z.q痹磰-定。
Question 3: f玜K收e傂缘腢O楲。
Answer:f玜KUO楲收e傂杂袝莒赌P捅旧砦锢硇缘膤哺駛fB晸性}哺竦膴-定。uvq!法收e偟膄B候Qi者都必?作}哺袷誩傂缘膎,奻。妔情娝S脮盕lomerics }舱? http://doc.001pp.com/)中的技圫文件”Convergence and Transient Simulation”
何?局部加密??????????????????????????????????????????????????????????????????????????????????????????????
局部}哺窦用芾韸??????????????????????????????????????????
Validation - 1D Conduction Without validation of the most basic of cases there is no way trust can be gained in the localized grid solution of more complex models. This model shows that a perfect linear variation in T in this conduction only analysis is predicted both with and without the use of localized grid. It is my belief that if this case was set up and solved in competitive codes that offered such a 内容过长,仅展示头部和尾部部分文字预览,全文请查看图片预览。 r grid both localized and non-localized. This therefore demonstrates that the difference observed in the first graph was because BOTH localized and non-localized were not grid independent. " Don't assume that if localized does not equal non-localized that the localized grid is wrong some how"
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